02 / PRECISION & DYNAMIC RESPONSE
Sub-micron high-speed laser displacement gauges
Resolve the movement your process depends on.
Review high-speed laser displacement gauges for battery electrode thickness, wafer runout and spindle vibration. Define the required bandwidth, target surface and uncertainty together.
Configure LDS-PRO ↗Request the proposed model’s CAD package ↗
LDS-PRO / INQUIRY CONFIGURATIONS
Match optical geometry to the dynamic measurement.
Use these references to describe the requested geometry. They are planning identifiers, not released model specifications. The quotation must confirm the order code, achievable performance, optical arrangement and drawing.
| Inquiry reference | Center / half-span request | Requested near → far | Qualification needed | Enquire |
|---|---|---|---|---|
| LDS-PRO-010 | 10 ± 2 mm | 8 → 12 mm (4 mm span) | Qualify resolution, linearity and repeatability at the requested rate, exposure and averaging. | Use LDS-PRO-010 ↗ |
| LDS-PRO-030 | 30 ± 5 mm | 25 → 35 mm (10 mm span) | Qualify resolution, linearity and repeatability at the requested rate, exposure and averaging. | Use LDS-PRO-030 ↗ |
| LDS-PRO-080 | 80 ± 15 mm | 65 → 95 mm (30 mm span) | Qualify resolution, linearity and repeatability at the requested rate, exposure and averaging. | Use LDS-PRO-080 ↗ |
| LDS-PRO-150 | 150 ± 40 mm | 110 → 190 mm (80 mm span) | Qualify resolution, linearity and repeatability at the requested rate, exposure and averaging. | Use LDS-PRO-150 ↗ |
Near/far values above are geometry arithmetic, not measured performance. Confirm linearity, repeatability, temperature drift, spot size, measuring rate, supply voltage, enclosure rating and exact connector for the selected configuration.
LASER CLASS / INDUSTRIAL ENVIRONMENT
Confirm the class and test scope of the ordered variant.
Laser label and installation
Request the actual label, classification basis and instructions for this LDS-PRO configuration. Include reflective targets, external optics, covers and setup/service access in the machine review.
Environmental and market records
Match declared ingress/temperature limits and EMC, shock or vibration evidence to the complete assembly and test conditions. Identify the destination and applicable declaration/report scope.
Class, ratings, certificates and document availability require configuration-specific confirmation. A measurement output is not a certified personnel-protection function.
SURFACE RETURN / OPTICAL ARRANGEMENT
Diffuse and specular targets need different reviews.
A diffuse surface scatters light toward the receiving lens. A polished surface can concentrate the return in a narrow direction. The sensor mounting, optical clearance and calibrated measurement arrangement must suit that return path.
Supply the surface finish and available installation angles. The drawing is conceptual; it does not prescribe one universal tilt angle or convert a diffuse head into a specular model.
Manufacturer example of measurement arrangements ↗
SPOT SIZE / SURFACE STRUCTURE
Narrow point or wide spot: define the feature you need to retain.
Narrow-point review
A small footprint can distinguish closely spaced features, but local texture and changing reflection can affect the reading. State the smallest feature, scan direction and spot dimensions needed across the entire measuring range.
Wide-spot or short-line review
A broader footprint with suitable signal processing can average local surface structure. It can also blend an edge, groove or narrow defect that the process needs to detect. A short-line displacement head returns a distance; it does not automatically provide a 2D height profile.
Compare both approaches on the actual surface, feature orientation and line speed. Record spot dimensions, invalid readings, filtering latency and repeatability against an independent reference. Wide-spot availability for an LDS-PRO configuration requires confirmation; changing the beam shape or averaging does not establish its accuracy.
Manufacturer example of short-line displacement optics ↗405 NM REVIEW / HOT AND TRANSPARENT TARGETS
Choose the optical response, then validate the surface.
Hot glowing metal
Shorter wavelength and appropriate filtering may improve contrast against thermal radiation. Radiation load, hot-air refraction, stand-off, exposure and the head’s ambient limit remain separate checks.
Transparent layers
Different interfaces can generate multiple peaks. Identify the intended surface, layer thickness and refractive behavior. Wavelength alone does not prove single-sided layer-thickness capability.
Fast moving sheet
Report required uncertainty at the actual line speed and filter settings. For two heads, confirm hardware synchronization, spot alignment, frame stability and the combined error budget.
LDS-CNF and LDS-MIC are technology-review interests, not released catalog models. Availability and specifications require a separate proposal.
Compare the complete installation cost.
Compare two USD acquisition scopes, identify missing costs and take the worksheet to the engineering enquiry.
Open the price and scope worksheet ↗SELECTION REVIEW / LDS-PRO
Set the acceptance conditions with the configuration.
10±2 to 150±40 mm requests
0.05–0.25 μm resolution targets
10–50 kHz rate requests · analog / Ethernet
These are selection envelopes. Maximum field, rate, resolution and interface functions require confirmation for the same ordered configuration.
Requested center / half-range options: 10±2, 30±5, 80±15 and 150±40 mm. Resolution is not absolute accuracy; request linearity, temperature drift and a calibration report at the selected measuring rate.
Review 655 nm red or 405 nm blue optical configurations. Transparent layers and mirror surfaces need the appropriate receiver geometry and signal processing; wavelength alone does not establish suitability.
Specify ±10 V, 4–20 mA, RS422, Ethernet TCP/IP or EtherCAT as an ordered variant. Confirm latency, timestamps, synchronization and simultaneous-channel behavior before a differential measurement.
Application focus: Electrode coating · wafer runout · spindle vibration
Existing-family references: Keyence LK-G5000 · Micro-Epsilon optoNCDT 1750 / 2300 · Omron ZW / ZX2. Send the full suffix, drawing and integration requirements for assessment.
HARDWARE / INSTALLATION REFERENCE
Leave room for the optical head and cable exit.
Review the proposed head’s optical axis, mounting datum and clear return path before freezing the machine layout.
Representative housing views. Confirm the exact model, dimensions and supply scope. Housing color does not identify laser wavelength.
LDS-PRO / MEASURING GEOMETRY
Keep the optical path clear across the measuring field.
Use the measurement concept to define the target position and available access. Request the selected head’s calibrated field and clearance drawing.
Review the working principle ↗
TWO HEADS. ONE THICKNESS.
Measure the sheet,
even when it moves.
Opposed sensors measure both surfaces at the same position and time. With a calibrated fixed gap C, the geometry is:
Thickness T = C − (A + B)
Ideal rigid-body sheet motion cancels when both readings are synchronized and aligned. Real uncertainty includes both sensors, frame expansion, calibration, tilt and timing mismatch. Lateral spot offset also matters: a 0.5 mm offset with 1° sheet tilt produces about 8.7 μm of apparent thickness change. Align the spots and verify with a master thickness.
Request a matched LDS-TRI / LDS-PRO pair, synchronized calculator and C-frame. Micron-level thickness requires validation of the complete assembly.
CHOOSE THE MEASURING PRINCIPLE
Small movements. Long distances.
Different optical tools.
| Decision | Laser triangulation | Phase-shift distance |
|---|---|---|
| Typical requirement | Short stand-off; micron-level displacement | Plant-scale travel; millimeter-level distance |
| How it measures | Target spot position on a CMOS detector | Phase delay of modulated returning light |
| Choose for | Thickness, runout, height, gap | Stacker cranes, long travel, remote positioning |
| Family | LDS-TRI / LDS-PRO; LDS-2D for profiles | LDS-LNG; range depends on target |
| Verify | Surface, angle, linearity, measuring rate | Reflectivity, ambient light, update rate, confidence level |
Resolution, repeatability and absolute accuracy describe different properties. Request the selected configuration’s measurement conditions.
LDS-PRO / ENGINEERING HANDOFF
Request the files your design review needs.
Ask for the proposed model’s current revision. File availability, supported functions and calibration scope are confirmed during configuration review.
Dimensioned drawing / 3D STEP
Add this document request ↗REQUEST / clearanceOptical clearance & mounting drawing
Add this document request ↗REQUEST / pinoutModel-specific M12 pin assignment
Add this document request ↗REQUEST / modbusAnalog scaling / RS485 register map
Add this document request ↗REQUEST / networkFieldbus description file / SDK
Add this document request ↗REQUEST / calibrationCalibration scope & report sample
Add this document request ↗REQUEST / safetyLaser safety & environmental documentation
Add this document request ↗M12 pin count is only the first check.
Housing dimensions, optical-axis height, mounting holes, connector clearance and cable bend space.
Connector coding, supply and ground, analog reference, output polarity, load and shield termination. Request the drawing for both complete part numbers.
Scaling, register or process-data map, units, invalid-data flags, trigger behavior, update period and the correct IODD / ESI / GSDML / EDS file where supported.
FROM COMPONENT TO MEASUREMENT
Plan the application around the measurement.
Battery electrode & sheet thickness
Specify the complete measurement loop: two surfaces, two synchronized distance readings and one calibrated frame. Start by defining whether you need total sheet thickness or coating thickness alone.
Review the measurement plan ↗SEMICONDUCTOR / PCB / PRECISION ASSEMBLYWafer & PCB warpage
A height map becomes useful only when its reference plane, support condition and scan coordinates are defined. Treat an opaque PCB, a polished wafer and a transparent layer stack as separate optical jobs.
Review the measurement plan ↗LDS-PRO / BEFORE THE DRAWING REVIEW
Resolve the questions that change the configuration.
Does 0.05 μm resolution mean 0.05 μm accuracy?
No. Resolution, repeatability, linearity and temperature drift are separate. Request their conditions at your measuring rate, exposure and filtering settings.
Will two heads remove all sheet-motion error?
Ideal common motion cancels with opposed aligned readings taken at the same time. Timing mismatch, lateral spot offset, tilt, frame expansion and both sensor errors remain in the thickness uncertainty budget.
Should glass always use a blue laser?
No. Identify the surface or layer first. Receiver geometry and peak separation may matter more than wavelength; transparent single-sided thickness may need spectral-confocal assessment.
LDS-PRO / CONFIGURATION & DOCUMENT REQUEST